MPI QAlibria® RF校正ソフトウェア
MPIが長い間経験してきたウエハレベルでのRF校正およびマイクロ波測定に関する豊富な経験に基づいて生まれたのが、QAlibria® RF校正ソフトウェアです。Qalibria®は複雑で面倒なRF校正を簡単に実行します。
マルチタッチ式、多言語、グラフィック・ユーザインタフェースに加えて、NISTのマルチラインTRL校正法を取り入れることにより、ウエハレベルのRF校正に革命を起こしました。
Multi-Touch UX
QAlibria® introduces a unique, pioneering multitouch single-window interface designed for maximum usability. Intelligent GUI logic guides every step, making the system easy to use for both experts and average-skilled operators. The result is a clean, intuitive workflow for all everyday measurement tasks.
Calibration Reporting Tool
QAlibria® turns a time-consuming reporting task into a simple one-click step. It automatically backs up all calibration data and generates a report in MS Word format with measurements and validation. The useful report eliminates manual documentation of the calibration procedure, saves valuable engineering time, and greatly improves traceability in the lab.
Link with NIST StatistiCal and scikit-RF
QAlibria® links directly with NIST StatistiCAL and the Python scikit-RF library, giving users access to the most advanced calibration algorithms, including NIST mTRL and the mTRL implementation from Graz University of Technology (TUG). StatistiCAL, developed by the National Institute of Standards and Technology in the USA, is the metrology reference for highest-accuracy on-wafer calibration at mmWave and THz frequencies. The TUG mTRL method improves the robustness of the calibration process, particularly for PCB-based calibrations where line dispersion and variability are more challenging.
With QAlibria®, all these powerful methods are fully integrated into a simple daily workflow, providing straightforward access even for non-experts.
Native on-wafer Calibration Workflow
Through its full integration with SENTIO®, QAlibria® becomes the natural engine of the on-wafer calibration workflow. SENTIO natively supports custom on-wafer standards, and QAlibria® applies the most advanced calibration methods, including MPI’s TMRR and the Multiline TRL, both optimized for work with custom substrates.
Together, this solution delivers a significant leap in measurement accuracy and calibration stability at mmWave frequencies and across temperatures. It reduces the number of required recalibration cycles and makes high-end calibration at extremes as straightforward as everyday operation.
Data and Calibration Validation
QAlibria® validates data at every critical step, checking the repeatability and consistency of standard measurements as well as the accuracy of the calibration. It adapts easily to system specifics and detects issues such as bad contact, damaged cables, VNA problems, incorrect settings, operator mistakes, or faulty standards. An intuitive multitouch visual interface with clear pass/fail margins lets experts define precise criteria while giving less experienced users a safe, guided workflow.
The result is reliable calibration and full confidence in the measurement data.
Drift Monitoring
QAlibria® flexible system drift monitoring can be easily configured to the measurement conditions relevant for specific device characterization tasks. It provides clear qualitative feedback on when the system needs to be re-calibrated and supports both manual and automated execution, including remote control.
This simplifies complex workflows, such as Automated Test at Multiple Temperatures (ATMT™), and ensures full confidence in the resulting data.
Open Database
QAlibria® features an open database for probe and calibration substrate parameters. It supports the entire MPI TITAN™ probe families, the matching calibration substrates, and most configurations from other vendors. The database can be easily edited to add custom on-wafer standards.
This flexibility allows QAlibria® to calibrate nearly any system out of the box.
MPI’s TMRR Calibration Method
MPI’s TMRR algorithm is a next-generation calibration method designed for custom on-wafer standards and the challenges of mmWave and over-temperature characterization. By extending the TRM approach with an additional Reflect and data redundancy, TMRR improves the robustness, consistency, and reproducibility of the results. Proven up to 220 GHz, it provides a stable and reliable workflow for demanding on-wafer applications.
