LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

ウェハーテストの最適化を実現します

最先端デバイス測定を

最新ターンキーソリューションで解決いたします

PA201-1114-FFB81C
Fully Auto Laser Diode Prober

ウエハー、デバイスの先進的自動測定、検査技術

フォトニクス、光電気デバイス

レーザー、

関連産業

LED

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A201-1114-FFB81C
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TS3000-SE.fw

最先端半導体テストソリューション

研究開発用プローブ・ステーション

RF

プローブ

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ThermalAir

シリーズ

高低温温度環境試験装置

温度環境試験チャンバー

高速温度サイクル・テスト

-80°C to +225°C

、省エネ設計

温度範囲:

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MPI Introduces Unique NoiseShield™ Option for 1/f (Flicker) & RTN Measurements

Advanced Semiconductor Test

New

MPI introduced a new NoiseShield™ option, which provides excellent EMI-shielding, low impedance grounding and shortest possible cable lengths to reduce parasitic capacitance and to maximize the test system roll-off frequency.

TS2000-SE Configured with the New MPI THZ-Selection

Advanced Semiconductor Test

New

MPI THZ-Selection converts TS2000-SE system into a dedicated, mmW and THz probe station, as the first one on the market.

The New MPI ITS25-THZ IMPACT™ Test Solution

Advanced Semiconductor Test

New

Enabling cost effective mmW and THZ testing with the highest possible measurement accuracy.

Factsheet now available.

Thermal Accessories that Meet Your Temperature Test Need

Thermal Test

New

MPI Thermal provides full array of intuitive functioning accessories for the ThermalAir users to flexibly and accurately test their components or device at the thermal test workstation.

MPI Thermal New ThermalAir TC-100 Gas Chiller

Thermal Test

New

Discover the evolutionary ThermalAir TC-100 Gas Chiller which focuses on localized temperature inducing of continuous -80°C Clean Dry Air.

Datasheet now available.

Enhanced Vertical Solution 80

Probe Cards

New

Probe your device with MPI’s Enhanced Vertical Solution 80 to enjoy the benefit of stable performance. Contact us for detailed information on how we can probe more efficiently and effectively.

MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization

Advanced Semiconductor Test

New

MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.

TITAN™ Multi-Contact Probe Online Design Capture Form

Advanced Semiconductor Test

New

Request for quote now! – Use Online Design Capture Form to build your probe by choosing RF signal (S), logic (L) and power supply (P) channels according to your IC pad layout.

2019 Asia-Pacific Microwave Conference (APMC)

December 11-13, 2019

Advanced Semiconductor Test

Sands Expo & Convention Centre, Level 4, Marina Bay Sands, Singapore

Booth No. B4

Event

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