TS3000-SiPH Automated Probe System | 300 mm Wafer Probing | TS3000-SiPH Automated Probe System | Wafer Test | Wafer Probe Testing | TS3000-SiPH Automated Probe System | Wafer Prober Machine 

Characterizing Silicon Photonics | 300mm Probe Stations

TS3000-SiPH Automated Probe System | Manual Probe System

300 mm Wafer Probing |  Characterizing Silicon Photonics  

Device Characterization

High Power

RF-mmW

Design Validation

Failure Analysis

Wafer Level Reliability

Silicon Photonics

MPI SiPH Probe Systems

MPI SiPH Probe Systems

TS3000 for Silicon Photonics on Wafer Test

MPI designed dedicated SiPH Upgrades for its well-known TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE probe systems, which includes:

  • Various options of high-precision fiber alignment systems for ultra-fast scanning routines
  • Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration
  • Integrated Z-sensing for detecting the fiber to wafer contact point
  • Crash protection when using two optical fiber arms
  • Wide temperature range from -40°C to 200°C
  • Optional dark box for testing in light tight environment
  • Extensive software package for supporting easy integration to operator’s test executive

SiPH Upgrade Data Sheet

Features & Benefits

Silicon Photonics Alignment System Integration

Silicon Photonics Fiber Alignment Systems

Various fiber positioning options can be used in concert with MPI’s SiPH probe systems. Short probe arms, due to a reduced platen to chuck distance, allowing ultra-fast alignment times for performing repeatable measurements in an automated test environment. Solutions for single fibers and fiber-arrays are available, all utilize automated z-height control to maintain the fiber distance to the optical I/O’s within a few microns.

Integrated SiPH Control Hardware

Seamless Probe Station Integration

Necessary optical alignment stages, such as the hexapod, are fully integrated into the SENTIO® probe station control software. Those are operated just like any other automated positioner including its additional alignment features. And not only integrated in the multi touch software, even the hardware control panel supports the SiPH positioner type.

For easy test executive integration of the SiPH functionality MPI is providing free sample scripts. Those are covering all necessary operation required for automated testing.

SiPH Integrated Measurement Instrumentation

Embedded Hardware Control

The SiPH components shelf is designed to hold all the positioning control hardware, completely integrated without adding additional floor space. It is placed in user friendly distance for convenient setup operation. Additionally the standard probe station instrument shelf is available to place all required optical and electrical measurement equipment.

Feel the Difference

MPI Software Suite SENTIO®

Software Suite SENTIO®

MPI automated engineering probe systems are controlled by a unique and revolutionary, multi-touch operation SENTIO® Software Suite – simple and intuitive operation saves significant training time, the Scroll, Zoom, Move commands mimic modern smart mobile devices and allows everyone to become an expert in just minutes. Switching between the active application and the rest of the APPs is just matter of a simple finger sweep.

For easy test executive integration of the SiPH functionality MPI is providing free sample scripts. Those are covering all necessary operation required for automated testing.

 

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