ウェハーテストの最適化を実現します
最新ターンキーソリューションで解決いたします
最先端デバイス測定を
ウエハー、デバイスの先進的自動測定、検査技術
フォトニクス、光電気デバイス
レーザー、LED関連産業
最先端半導体テストソリューション
研究開発用プローブ・ステーション
RFプローブ
ThermalAir シリーズ 高低温環境試験装置
温度環境試験チャンバー
高速温度サイクル・テスト
-80°C to +225°C - 省エネ設計
超高性能プローブカード
最低の所有コストで極限のテスト能力を提供します。
APMC 2024
先端半導体テスト
イベント
開催日: 2024年11月17 – 20日
会場: Anvaya Beach Resort, Bali, Indonesia
ブース番号: 3
MPI Corporation’s Advanced Semiconductor Test Division Joins Forces with Keysight Technologies as a Keysight Solutions Partner
先端半導体テスト
ニュース
Hsinchu, Taiwan – March 11, 2024
MPI Corporation, a global leader in semiconductor testing solutions, is pleased to announce a landmark partnership with Keysight Technologies, a global innovation partner delivering market-leading design, emulation, and test solutions to help engineers develop and deploy faster. This collaboration marks...
MPI Corporation’s Advanced Semiconductor Test Division Achieves Fully Traceable RF Calibration Breakthrough Up to 110 GHz
先端半導体テスト
ニュース
Braunschweig, Germany, January 25, 2024
MPI Corporation’s Advanced Semiconductor Test (AST) Division, a pioneer in on-wafer testing solutions, today announced a landmark achievement in RF calibration technology. Collaborating with the Physikalisch-Technische Bundesanstalt (PTB)...
MPI SENTIO® and QAlibria® Unsurpassed Usability is Now Extended to Automated Four-Port RF System Calibration
先端半導体テスト
ニュース
Hsinchu, Taiwan, December 8, 2022
MPI Corporation’s Advanced Semiconductor Test Division, an industry and innovation leader in semiconductor RF test solutions, demonstrated unattended four-port RF calibration and measurements supported by the new versions of QAlibria® and SENTIO®, MPI’s...
TS2000-IFE Series – THZ Selection
先端半導体テスト
製品情報
THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.
Celadon Multisite Tile-on-Card™ Production Probe Card
セラドン
製品情報
Functional Test, 200C, Production Probe Card
Celadon Cryogenic Minitile™
セラドン
製品情報
Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
セラドン
製品情報
Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing
Celadon VC43™ and P9000 Production Parametric Probe Card
セラドン
製品情報
Modular, -65 to 200C, 100 channel, Probe Card
The Latest in mmWave and THz Test and Measurement Technology
先端半導体テスト
ニュース
This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)