ウェハーテストの最適化を実現します
ウェハーテストの最適化を実現します
最先端デバイス測定を
最先端デバイス測定を
最新ターンキーソリューションで解決いたします
最新ターンキーソリューションで解決いたします
ウエハー、デバイスの先進的自動測定、検査技術
ウエハー、デバイスの先進的自動測定、検査技術
フォトニクス、光電気デバイス
フォトニクス、光電気デバイス
レーザー、
レーザー、
関連産業
関連産業
LED
LED
最先端半導体テストソリューション
最先端半導体テストソリューション
研究開発用プローブ・ステーション
研究開発用プローブ・ステーション
RF
RF
プローブ
プローブ
ThermalAir
ThermalAir
シリーズ
シリーズ
高低温温度環境試験装置
高低温温度環境試験装置
温度環境試験チャンバー
温度環境試験チャンバー
高速温度サイクル・テスト
高速温度サイクル・テスト
-80°C to +225°C
-80°C to +225°C
、省エネ設計
、省エネ設計
温度範囲：
温度範囲：
Ultra-High Performance Probe Cards
Ultra-High Performance Probe Cards
With the Lowest Cost of Ownership
With the Lowest Cost of Ownership
Delivering Extreme Test Capabilities
Delivering Extreme Test Capabilities
99th ARFTG Microwave Measurement Conference
Advanced Semiconductor Test
Event
Date: June 24, 2022
Venue: Hyatt Regency at Colorado Convention Center, Denver, CO, USA
International Microwave Symposium (IMS) 2022
Advanced Semiconductor Test | Thermal Test
Event
Date: June 21 – 23, 2022
Venue: Colorado Convention Center, Denver, CO, USA
Booth: #9058
SWTest 2022
Probe Card
Event
Date: June 5-8, 2022
Venue: Omni La Costa in Carlsbad, CA, USA
TS2000-IFE Series – THZ Selection
Advanced Semiconductor Test
New
THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.
Celadon Multisite Tile-on-Card™ Production Probe Card
Celadon Systems
New
Functional Test, 200C, Production Probe Card
Celadon Cryogenic Minitile™
Celadon Systems
New
Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
Celadon Systems
New
Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing
Celadon VC43™ and P9000 Production Parametric Probe Card
Celadon Systems
New
Modular, -65 to 200C, 100 channel, Probe Card
The Latest in mmWave and THz Test and Measurement Technology
Advanced Semiconductor Test
New
This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)
Video: Perfection comes from MPI Production
Probe Card
Video
Our probe cards' secret behind the consistent performance is that we have full control over the most important components, substrates and probes. Watch the video to find out how we do it.
Your recipe of on-wafer calibration for accurate mm-wave characterisation of advanced silicon devices
Advanced Semiconductor Test
Video
This presentation discusses solutions for both metrology-grade and production-suitable calibration methods and will share some experimental results and practical recommendations.
MPI Thermal moves to bigger facilities!
Thermal Test
New
Taiwan, February 1, 2021 - MPI Thermal (a division of MPI Corporation), the worldwide leader of thermal stream temperature forcing systems, has moved.
MPI AST in New Facility
Advanced Semiconductor Test
New
Hsinchu, Taiwan, February 1, 2021 - MPI’s Advanced Semiconductor Test Division (AST) proudly announces a move into a new 5-floor facility located next to the original MPI Corporate Headquarters in Hsinchu, Taiwan.
