ウェハーテストの最適化を実現します
ウェハーテストの最適化を実現します
最先端デバイス測定を
最先端デバイス測定を
最新ターンキーソリューションで解決いたします
最新ターンキーソリューションで解決いたします
ウエハー、デバイスの先進的自動測定、検査技術
ウエハー、デバイスの先進的自動測定、検査技術
フォトニクス、光電気デバイス
フォトニクス、光電気デバイス
レーザー、
レーザー、
関連産業
関連産業
LED
LED
最先端半導体テストソリューション
研究開発用プローブ・ステーション
RF
プローブ
ThermalAir
ThermalAir
シリーズ
シリーズ
高低温温度環境試験装置
高低温温度環境試験装置
温度環境試験チャンバー
温度環境試験チャンバー
高速温度サイクル・テスト
高速温度サイクル・テスト
-80°C to +225°C
-80°C to +225°C
、省エネ設計
、省エネ設計
温度範囲：
温度範囲：
Ultra-High Performance Probe Cards
Ultra-High Performance Probe Cards
With the Lowest Cost of Ownership
With the Lowest Cost of Ownership
Delivering Extreme Test Capabilities
Delivering Extreme Test Capabilities
MPI SENTIO® and QAlibria® Unsurpassed Usability is Now Extended to Automated Four-Port RF System Calibration
Advanced Semiconductor Test
News
Hsinchu, Taiwan, December 8, 2022
MPI Corporation’s Advanced Semiconductor Test Division, an industry and innovation leader in semiconductor RF test solutions, demonstrated unattended four-port RF calibration and measurements supported by the new versions of QAlibria® and SENTIO®, MPI’s...
MPI Corporation has Installed its
WaferWallet®MAX for 200mm and 300mm WLR Processes
Advanced Semiconductor Test
News
Hsinchu, Taiwan, July 28, 2022
MPI Corporation’s Advanced Semiconductor Test Division, an industry and innovation leader of semiconductor test solutions initiated the integration of the TS3500-SE automated wafer probe test system with WaferWallet®MAX...
100th ARFTG Microwave Measurement Conference
Advanced Semiconductor Test
Event
Date: January 23-24, 2023
Venue: Planet Hollywood, Las Vegas, Nevada, USA
Booth: 210
DesignCon 2023
Thermal
Event
Date: January 31 – February 02, 2023
Venue: Santa Clara Convention Center, CA, USA
Booth: 1438
OFC 2023
Photonics Automation | Advanced Semiconductor Test | Thermal
Event
Date: March 07-09, 2023
Venue: San Diego Convention Center, CA, USA
Booth: 4817
ICMTS 2023
Advanced Semiconductor Test
Event
Date: March 27-29, 2023
Venue: The University of Tokyo, Tokyo, Japan
TS2000-IFE Series – THZ Selection
Advanced Semiconductor Test
New
THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.
Celadon Multisite Tile-on-Card™ Production Probe Card
Celadon Systems
New
Functional Test, 200C, Production Probe Card
Celadon Cryogenic Minitile™
Celadon Systems
New
Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
Celadon Systems
New
Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing
Celadon VC43™ and P9000 Production Parametric Probe Card
Celadon Systems
New
Modular, -65 to 200C, 100 channel, Probe Card
The Latest in mmWave and THz Test and Measurement Technology
Advanced Semiconductor Test
New
This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)
Video: Perfection comes from MPI Production
Probe Card
Video
Our probe cards' secret behind the consistent performance is that we have full control over the most important components, substrates and probes. Watch the video to find out how we do it.
