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Logic IC

MPI’s probe cards are used in wafer tests with small pad size, quad-site shelf and multi-DUT for Logic IC. These probe card are using for high parallelism, which reduce the cost of test and produced for using with digital, analog, mixed-signal, etc.

Logic IC Features include:

  • Multi-DUT
  • Shelf probe card
  • 2X2DUT
  • Fine pitch
  • 4 rows staggered pad
  • Small pad size
  • High speed
Logic IC | Probe Cards | LCD Driver Probe Card | Cantilever Probe Cards | Wafer Probe Cards | Logic IC | Probe Cards
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