International Microwave Symposium (IMS) 2020 – Virtual Event


Please note: Only registered attendees will be able to access the virtual event, on demand content and exhibition. ⇒ Register Now

Registration for attendee registration will close on September 25th at midnight Hawaii time. The Exhibition is open until September 30th.

[Subject]: Addressing Calibration and Measurement Challenges of Broadband On-wafer VNA Measurements up to 220 GHz

[Presenter]: Steve Reyes & Dr. Jon Martens, Anritsu Company, Dr. Andrej Rumiantsev, MPI Corporation



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