- January 27-28, 2020
- Grand Hyatt San Antonio, TX, USA
- Booth No. 111
- Participating Division: Advanced Semiconductor Test
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[Subject]: On-Wafer System Calibration for mm-Wave Frequency Applications
[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation, and Dr. Marco Spirito, Delft University of Technology.
[Time]:
08:00 – 17:00: NIST/ARFTG Short Course, Sunday, January 26
08:00 – 12:00: NIST/ARFTG Short Course, Monday, January 27
[Venue]: Room Travis AB
[Subject]: How to Design Your Own on-Wafer Calibration Standards and Why You Should Do It
[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation, and Dr. Marco Spirito, Delft University of Technology.
[Time]: 11:15 – 12:00: Workshop on Advanced Measurements for RF Silicon, Wednesday, January 29
[Venue]: Republic B
[Subject]: Calibration Substrate Design for Accurate mm-Wave Probe-Tip Calibration
[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation; Ralf Doerner, Ferdinand-Braun-Institut (FBH), and Gia Ngoc Phung, Ferdinand-Braun-Institut (FBH)
[Time]: 16:10 – 16:30: Conference Presentation, Session B: On-Wafer and mm-Wave Measurements, Monday, January 27