• Aug 4-6, 2020
• Participating Divisions: Advanced Semiconductor Test | Thermal Test

Please note: Only registered attendees will be able to access the virtual event, on demand content and exhibition. ⇒ Register Now

Registration for attendee registration will close on September 25th at midnight Hawaii time. The Exhibition is open until September 30th.

[Subject]: Addressing Calibration and Measurement Challenges of Broadband On-wafer VNA Measurements up to 220 GHz

[Presenter]: Steve Reyes & Dr. Jon Martens, Anritsu Company, Dr. Andrej Rumiantsev, MPI Corporation

• July 16-17, 2020                                             
• Participating Division: Advanced Semiconductor Test

• June 27-29, 2020

• Shanghai New International Expo Centre, China

• Booth No. E3166, Hall E3

• Participating Division: Advanced Semiconductor Test

• March 10-12, 2020   
• San Diego Convention Center, CA, USA
• Booth No. 2613  
• Participating Division: Photonics Automation | Thermal
• Booth No. 2010 (Optical Fiber Test & Measurement Center)
• Participating Division: Advanced Semiconductor Test

• March 10-12, 2020   
• San Diego Convention Center, CA, USA
• Booth No. 2613  
• Participating Division: Photonics Automation | Thermal